Sirvi Autor "Stonytė, Dominyka" järgi

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Extending the Depth of Focus of Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride
(2024) Han, Molong; Smith, Daniel; Kahro, Tauno; Stonytė, Dominyka; Kasikov, Aarne; Gailevičius, Darius; Tiwari, Vipin; Xavier, Agnes Pristy Ignatius; Gopinath, Shivasubramanian; Ng, Soon Hock; Rajeswary, Aravind Simon John Francis; Tamm, Aile; Kukli, Kaupo
Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable, as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on a barium fluoride substrate close to the sample. Preliminary results of imaging the thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and an increase in background noise.