CLIC electrical breakdown studies: Cu self-sputtering MD simulations for 0.1-5 keV ions at elevated temperatures

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dc.contributor.advisorZadin, Vahur, juhendaja
dc.contributor.advisorDjurabekova, Flyura, juhendaja
dc.contributor.advisorAvchaciov, Konstantin, juhendaja
dc.contributor.authorMetspalu, Tarvo
dc.contributor.otherTartu Ülikool. Loodus- ja tehnoloogiateaduskondet
dc.contributor.otherTartu Ülikool. Füüsika instituutet
dc.date.accessioned2015-06-09T11:44:35Z
dc.date.available2015-06-09T11:44:35Z
dc.date.issued2015
dc.description.urihttp://www.ester.ee/record=b4482568et
dc.identifier.urihttp://hdl.handle.net/10062/46783
dc.language.isoetet
dc.publisherTartu Ülikoolet
dc.subject.othermagistritöödet
dc.subject.otherläbilöök (elektr.)et
dc.subject.othervasket
dc.subject.othermolekulaardünaamikaet
dc.titleCLIC electrical breakdown studies: Cu self-sputtering MD simulations for 0.1-5 keV ions at elevated temperaturesen
dc.typeThesiset

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