Atomic layer deposition of artificially structured dielectric materials
dc.contributor.author | Kukli, Kaupo | |
dc.date.accessioned | 2014-09-18T10:44:16Z | |
dc.date.available | 2014-09-18T10:44:16Z | |
dc.date.issued | 1999 | |
dc.description.uri | https://www.ester.ee/record=b1164468*est | et |
dc.identifier.isbn | 9789949376438 | |
dc.identifier.other | Diss.A-2325 | |
dc.identifier.uri | http://hdl.handle.net/10062/43525 | |
dc.language.iso | en | et |
dc.publisher | Tartu : Tartu University Press | et |
dc.relation.ispartofseries | Dissertationes physicae Universitatis Tartuensis, 1406-0647;27 | |
dc.subject | oksiidkiled | et |
dc.subject | aatomkihtsadestamine | et |
dc.subject | füüsikalised omadused | et |
dc.subject | dissertatsioonid | et |
dc.title | Atomic layer deposition of artificially structured dielectric materials | et |
dc.type | Thesis | et |