Spectroskopic ellipsometry as a versatile tool to study thin films grown by atomic layer deposition

Thumbnail Image

Files

roland_hoxha_mooteteadus_mag14.pdf (4.82 MB)

Date

2014

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Tartu Ülikool

Abstract

Description

Keywords

Citation

URI

http://hdl.handle.net/10062/43373

Collections

Rakendusliku mõõteteaduse õppekava magistritööd – Master's theses