Spectroskopic ellipsometry as a versatile tool to study thin films grown by atomic layer deposition

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roland_hoxha_mooteteadus_mag14.pdf (4.82 MB)

Date

2014

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Tartu Ülikool

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http://hdl.handle.net/10062/43373

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Rakendusliku mõõteteaduse õppekava magistritööd – Master's theses